Optical Device Test and Characterization
PIC and Silicon Photonics Testing
Photonic integrated circuits (PICs) are a key enabler driving advances in communications, optical computing, aerospace, defense and medical applications.
However, PICs introduce unique measurement challenges, and testing remains a large contribution to the overall cost of bringing products to market. Effective testing of modern PICs requires more comprehensive and sophisticated methodologies to ensure optimal performance and reduced development costs.
Luna广泛的测试和测量解决方案为客户提供了高精度，分辨率和测量速度仪器，以定量评估芯片上每个组件的光学性能，无论是早期的原型设计阶段还是在生产中。
Luna has the technology to look inside PICs in the transmission mode or reflection mode with micrometer-level spatial resolution for a complete optical characterization of the device.
Typical measurements include:
- Insertion loss (IL)
- Return loss (RL)
- Polarization-dependent loss (PDL) vs. wavelength
- 反射/传输损耗vs. distance
- 反射/传输损耗vs. wavelength
- Phase response
- Group delay (GD)
- 色散（CD）与波长
- Polarization mode dispersion (PMD) vs. wavelength
- Second-order PMD vs. wavelength
- Min/Max Loss due to Polarization
- 脉冲响应
- 琼斯矩阵和穆勒矩阵元素
- Phase Ripple – Linear and Quadratic
- Polarization Performance vs. Distance
- Polarization Crosstalk vs. Distance
- Degree of Polarization (DOP), State of Polarization (SOP) and Polarization Extinction Ratio (PER)
Featured Products
光纤网络测试
Test and characterize fiber optic cables, assemblies and network with unmatched speed, precision and spatial resolution. Luna’s OBR reflectometers can analyze loss with a spatial resolution and sensitivity unmatched in the industry.
Polarization Management and Emulation
Control and manage polarization in your optical system with our lossless fiber-squeezer based multifunctional polarization controllers for highest performance. Emulate all polarization impairment parameters including SOP, PMD, and PDL, with our complete line of emulation products for network and system characterization.