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Accelerate Silicon Photonics Development with Advanced Testing and Automation

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概述

该网络研讨会描述了Luna的硅光子检测和枫叶光子的模块化和灵活平台的Luna的先进方法，用于模具的自动化测试，以及这两种技术如何集成为硅光子的有效完整的解决方案。演示者将以快速和精确的设备表征技术和智能探头站技术展示如何，即使在晶圆完成之前，您也可以在制造过程中提高设计和制造保真度。

Attendees will learn how to extend these into the various stages of back-end processing, optical subassemblies and in component forms to speed your development cycles and eliminate non-value-added activities.

Key Takeaways

  • 了解在晶圆，模具和子组件水平下硅光子学测试的重要性和独特挑战
  • 了解如何使用Luna的OBR和OVA技术执行快速和详细的All-参数设备表征
  • Fully characterize your complex E-O designs earlier in the fabrication and development cycle to identify yield limitations, performance margins, fab errors and other missteps
  • Learn quickly and adapt your test protocols to reveal the most vital attributes representative of your designs in operation and to assure fabrication tolerances are maintained

Presenters

  • Brian J. Soller, Ph.D., Senior Vice President and General Manager, Luna Innovations
  • B. Roe Hemenway，Ph.D.，首席技术官员，枫叶光子学